Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Erschienen in
-
Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond ; day:29 ; month:10 ; year:2021 ; extent:36
Advanced science ; (29.10.2021) (gesamt 36)
- Urheber
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Lee, Yang‐Chun
Chang, Sih‐Wei
Chen, Shu‐Hsien
Chen, Shau‐Liang
Chen, Hsuen‐Li
- DOI
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10.1002/advs.202102128
- URN
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urn:nbn:de:101:1-2021103015140176826952
- Rechteinformation
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
- 15.08.2025, 07:27 MESZ
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Beteiligte
- Lee, Yang‐Chun
- Chang, Sih‐Wei
- Chen, Shu‐Hsien
- Chen, Shau‐Liang
- Chen, Hsuen‐Li
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