Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer‐Scale Growth and Beyond ; day:29 ; month:10 ; year:2021 ; extent:36
Advanced science ; (29.10.2021) (gesamt 36)

Creator
Lee, Yang‐Chun
Chang, Sih‐Wei
Chen, Shu‐Hsien
Chen, Shau‐Liang
Chen, Hsuen‐Li

DOI
10.1002/advs.202102128
URN
urn:nbn:de:101:1-2021103015140176826952
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:27 AM CEST

Data provider

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Associated

  • Lee, Yang‐Chun
  • Chang, Sih‐Wei
  • Chen, Shu‐Hsien
  • Chen, Shau‐Liang
  • Chen, Hsuen‐Li

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