Fabrication and characterization of Si1−xGex nanocrystals in as-grown and annealed structures: a comparative study
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Fabrication and characterization of Si1−xGex nanocrystals in as-grown and annealed structures: a comparative study ; volume:10 ; pages:1873-1882
Beilstein journal of nanotechnology ; 10, 1873-1882
- Classification
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.10.182
- URN
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urn:nbn:de:101:1-2020111915035371537516
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:24 AM CEST
Data provider
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
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