Hochschulschrift
Indium impurity pairs in semiconductors and the study of the influence of uniaxial stress on defect complexes in silicon
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Dimensions
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21 cm
- Extent
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129 S.
- Language
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Englisch
- Notes
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graph. Darst.
Bonn, Univ., Diss., 2003
- Keyword
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Silicium
Störstelle
PAC
Einachsiger Spannungszustand
Germanium
Störstelle
PAC
- Creator
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.06.2025, 2:17 PM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
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