Self-assembly of silicon nanowires studied by advanced transmission electron microscopy
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Self-assembly of silicon nanowires studied by advanced transmission electron microscopy ; volume:8 ; pages:440-445
Beilstein journal of nanotechnology ; 8, 440-445
- Classification
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.8.47
- URN
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urn:nbn:de:101:1-2018090517080590614272
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:34 AM CEST
Data provider
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