Stress evaluation and reliability of electrically conductive adhesive interconnections
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783934142596
- Dimensions
-
25 cm
- Extent
-
X, 163 S.
- Language
-
Englisch
- Notes
-
Ill., graph. Darst.
Zugl.: Freiburg (Breisgau), Univ., Diss., 2009
- Bibliographic citation
-
Buchreihe Aufbau- und Verbindungstechnik in der Elektronik ; Bd. 10
- Classification
-
Elektrotechnik, Elektronik
- Keyword
-
Klebeverbindung
Elektrische Leitfähigkeit
Zuverlässigkeit
Stoffeigenschaft
Temperaturverhalten
Feuchtigkeit
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.03.2025, 12:03 PM CET
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Löw, Richard Constantin
- Detert
Time of origin
- 2009
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