Hochschulschrift
Preparation and in-situ growth characterisation of X-ray multilayer structures
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Maße
-
21 cm
- Umfang
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II, 158, X S.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Hamburg, Univ., Diss., 1997
- Schlagwort
-
Wolfram
Silicium
Tantal
Mehrschichtsystem
Röntgenoptik
- Urheber
-
Lüken, Eike
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 14:04 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Objekttyp
- Hochschulschrift
Beteiligte
- Lüken, Eike
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