Hochschulschrift | Online-Publikation
Electromigration in bamboo aluminum interconnects
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Language
-
Englisch
- Notes
-
Stuttgart, Univ., Diss., 2000
- Keyword
-
Leiterbahn
Aluminium
Elektromigration
Bambusstruktur
Kupfer
- Creator
-
Witt, Christian
- URN
-
urn:nbn:de:bsz:93-opus-7930
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:24 AM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
- Online-Publikation
Associated
- Witt, Christian
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Electromigration in bamboo aluminum interconnects
Aluminum (I, II, III) compounds with multidentate ligands : syntheses, reactivity, and structures
Synthesis of organoaluminum fluorides and of an oxo-centered trinuclear carboxylate of aluminum
High speed VCSELs for optical interconnects
Novel coherent interconnects based on silicon
High speed VCSELs for optical interconnects
Morphology and crystallography of electromigration induced transgranular slit failures in aluminum alloy interconnects
Effect of aluminum and the over expression of an Arabidopsis thaliana Δ8-sphingolipid [Delta-8-sphingolipid] desaturase gene on the sphingoid base composition in maize (Zea mays, L.) roots
Integrated energy efficient silicon modulators for optical interconnects
Receiver arrays for chip and board optical interconnects
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