Data encoding for image scanning microscopy with photon arrival time measurements
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Klassifikation
-
Medizin, Gesundheit
- Ereignis
-
Veröffentlichung
- (wo)
-
München
- (wer)
-
Paustian & Partner
- (wann)
-
2024
- Beteiligte Personen und Organisationen
-
PAUSTIAN & PARTNER Patentanwälte mbB
- URN
-
urn:nbn:de:101:1-2406101513336.047166265865
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:43 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- PAUSTIAN & PARTNER Patentanwälte mbB
- Paustian & Partner
Entstanden
- 2024
Ähnliche Objekte (12)
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Scanning ion conductance microscopy
Scanning microscopy : symposium proceedings
Acoustic scanning probe microscopy
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Scanning acoustic tunneling microscopy and scanning acoustic force microscopy studies of oscillating surfaces
Spin-polarized scanning tunneling microscopy
Adaptive Scanning for STED Microscopy
Advances in scanning probe microscopy
Scanning probe microscopy : analytical methods
Materials Testing - Scanning Electron Microscopy
Spin-polarized scanning tunneling microscopy
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Scanning ion conductance microscopy
Scanning microscopy : symposium proceedings
Acoustic scanning probe microscopy
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Scanning acoustic tunneling microscopy and scanning acoustic force microscopy studies of oscillating surfaces
Spin-polarized scanning tunneling microscopy
Adaptive Scanning for STED Microscopy
Advances in scanning probe microscopy
Scanning probe microscopy : analytical methods
Materials Testing - Scanning Electron Microscopy
Spin-polarized scanning tunneling microscopy
Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy
Scanning ion conductance microscopy
Scanning microscopy : symposium proceedings
Acoustic scanning probe microscopy
Material Contrast by Scanning Electron Microscopy and Low-Energy Scanning Transmission Electron Microscopy
Scanning acoustic tunneling microscopy and scanning acoustic force microscopy studies of oscillating surfaces
Spin-polarized scanning tunneling microscopy
Adaptive Scanning for STED Microscopy
Advances in scanning probe microscopy
Scanning probe microscopy : analytical methods
Materials Testing - Scanning Electron Microscopy