Automatic beam optimization method for scanning electron microscopy based on electron beam Kernel estimation
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
-
Automatic beam optimization method for scanning electron microscopy based on electron beam Kernel estimation ; volume:3 ; number:1 ; day:20 ; month:6 ; year:2024 ; pages:1-15 ; date:12.2024
Communications engineering ; 3, Heft 1 (20.6.2024), 1-15, 12.2024
- Classification
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Elektrotechnik, Elektronik
- Creator
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Cho, Yunje
Cho, Junghee
Park, Jonghyeok
Wang, Jeonghyun
Jeong, Seunggyo
Lee, Jubok
Hwang, Yun
Kim, Jiwoong
Yu, Jeongwoo
Chung, Heesu
Park, Hyenok
Shon, Subong
Jo, Taeyong
Lee, Myungjun
Kim, Kwangrak
- Contributor
-
SpringerLink (Online service)
- DOI
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10.1038/s44172-024-00230-3
- URN
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urn:nbn:de:101:1-2409160934057.241881157566
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:25 AM CEST
Data provider
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Cho, Yunje
- Cho, Junghee
- Park, Jonghyeok
- Wang, Jeonghyun
- Jeong, Seunggyo
- Lee, Jubok
- Hwang, Yun
- Kim, Jiwoong
- Yu, Jeongwoo
- Chung, Heesu
- Park, Hyenok
- Shon, Subong
- Jo, Taeyong
- Lee, Myungjun
- Kim, Kwangrak
- SpringerLink (Online service)
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