Intense electron and ion beams

Intense Ion and Electron Beams treats intense charged-particle beams used in vacuum tubes, particle beam technology and experimental installations such as free electron lasers and accelerators. It addresses, among other things, the physics and basic theory of intense charged-particle beams, computation and design of charged-particle guns and focusing systems; multiple-beam charged-particle systems; and experimental methods for investigating intense particle beams. The coverage is carefully balanced between the physics of intense charged-particle beams and the design of optical systems for their formation and focusing. It can be recommended to all scientists studying or applying vacuum electronics and charged-particle beam technology, including students, engineers and researchers. TOC:1. Introduction to particle beam formation.- 2. Methods of fields calculation.- 3. Fundamentals of charged-particle motion.- 4. Motion of intense charged-particle beams.- 5. Electron guns.- 6. Electron and ion sources with field and plasma emitters.- 7. Magnetic focusing systems.- 8. Electrostatic focusing systems.- 9. Optical systems of technological installations.- 10. Intense relativistic charged-particle beams.- 11. Multiple-beam electron-optical systems.- 12. Methods of experimental investigation of beams

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISBN
9783540242208
3540242201
Dimensions
24 cm
Extent
XII, 281 S.
Language
Englisch
Notes
graph. Darst.
Literaturverz. S. 269 - 277

Classification
Physik
Keyword
Elektronenstrahl
Ionenstrahl

Event
Veröffentlichung
(where)
Berlin, Heidelberg, New York
(who)
Springer
(when)
2005
Creator
Molokovskij, Sergej I.
Suškov, Aleksandr D.

Table of contents
Rights
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
Last update
11.06.2025, 2:05 PM CEST

Data provider

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Associated

  • Molokovskij, Sergej I.
  • Suškov, Aleksandr D.
  • Springer

Time of origin

  • 2005

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