Polarized Raman Microscopy to Image Microstructure Changes in Silicon Phthalocyanine Thin‐Films

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
Online-Ressource
Language
Englisch

Bibliographic citation
Polarized Raman Microscopy to Image Microstructure Changes in Silicon Phthalocyanine Thin‐Films ; day:18 ; month:03 ; year:2024 ; extent:8
Small science ; (18.03.2024) (gesamt 8)

Creator
Cranston, Rosemary R.
Lanosky, Taylor D.
Ewenike, Raluchukwu
Mckillop, Sophia
King, Benjamin
Lessard, Benoît H.

DOI
10.1002/smsc.202300350
URN
urn:nbn:de:101:1-2024031913195887435683
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 10:44 AM CEST

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Associated

  • Cranston, Rosemary R.
  • Lanosky, Taylor D.
  • Ewenike, Raluchukwu
  • Mckillop, Sophia
  • King, Benjamin
  • Lessard, Benoît H.

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