Hochschulschrift
Dynamic thermal characterization of thin films via IR thermography
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783946379157
394637915X
- Maße
-
21 cm
- Umfang
-
vii, 138 Seiten
- Ausgabe
-
1. Auflage
- Sprache
-
Englisch
- Anmerkungen
-
Illustrationen
Technische Universität München, Dissertation, 2018
- Erschienen in
-
Selected topics of semiconductor physics and technology ; vol. 215
- Klassifikation
-
Physik
- Ereignis
-
Veröffentlichung
- (wo)
-
Garching
- (wer)
-
Verein zur Förderung des Walter Schottky Instituts der Technischen Universität München e.V.
- (wann)
-
Oktober 2018
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 13:32 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Objekttyp
- Hochschulschrift
Beteiligte
- Greppmair, Anton Josef
- Verein zur Förderung des Walter Schottky Instituts der Technischen Universität München e.V.
Entstanden
- Oktober 2018
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