Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1572-817X
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method ; volume:49 ; number:7 ; day:3 ; month:6 ; year:2017 ; pages:1-19 ; date:7.2017
Optical and quantum electronics ; 49, Heft 7 (3.6.2017), 1-19, 7.2017

Classification
Elektrotechnik, Elektronik

Creator
Fang, Y.
Contributor
Jayasuriya, D.
Furniss, D.
Tang, Z. Q.
Sojka, Ł
Markos, C.
Sujecki, S.
Seddon, A. B.
Benson, T. M.
SpringerLink (Online service)

DOI
10.1007/s11082-017-1057-9
URN
urn:nbn:de:1111-201708084473
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:31 AM CEST

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Associated

  • Fang, Y.
  • Jayasuriya, D.
  • Furniss, D.
  • Tang, Z. Q.
  • Sojka, Ł
  • Markos, C.
  • Sujecki, S.
  • Seddon, A. B.
  • Benson, T. M.
  • SpringerLink (Online service)

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