Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1572-817X
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Anmerkungen
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online resource.
- Erschienen in
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Determining the refractive index dispersion and thickness of hot-pressed chalcogenide thin films from an improved Swanepoel method ; volume:49 ; number:7 ; day:3 ; month:6 ; year:2017 ; pages:1-19 ; date:7.2017
Optical and quantum electronics ; 49, Heft 7 (3.6.2017), 1-19, 7.2017
- Klassifikation
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Elektrotechnik, Elektronik
- Urheber
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Fang, Y.
- Beteiligte Personen und Organisationen
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Jayasuriya, D.
Furniss, D.
Tang, Z. Q.
Sojka, Ł
Markos, C.
Sujecki, S.
Seddon, A. B.
Benson, T. M.
SpringerLink (Online service)
- DOI
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10.1007/s11082-017-1057-9
- URN
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urn:nbn:de:1111-201708084473
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:31 MESZ
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Beteiligte
- Fang, Y.
- Jayasuriya, D.
- Furniss, D.
- Tang, Z. Q.
- Sojka, Ł
- Markos, C.
- Sujecki, S.
- Seddon, A. B.
- Benson, T. M.
- SpringerLink (Online service)
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