Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource, 1 online resource.
- Language
-
Englisch
- Bibliographic citation
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Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions ; day:16 ; month:6 ; year:2023 ; pages:1-30
Flexible services and manufacturing journal ; (16.6.2023), 1-30
- Creator
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Deenen, Patrick C.
Middelhuis, Jeroen
Akcay, Alp
Adan, Ivo J. B. F.
- Contributor
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SpringerLink (Online service)
- DOI
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10.1007/s10696-023-09501-1
- URN
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urn:nbn:de:101:1-2023110109024609068230
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 10:44 AM CEST
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Associated
- Deenen, Patrick C.
- Middelhuis, Jeroen
- Akcay, Alp
- Adan, Ivo J. B. F.
- SpringerLink (Online service)
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Correction: Data-driven aggregate modeling of a semiconductor wafer fab to predict WIP levels and cycle time distributions
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Cycle Time Estimation in a Semiconductor Wafer Fab: A concatenated Machine Learning Approach
Ranking routes in semiconductor wafer fabs
WIP balance and due date control for complex job shops (wafer fabs)
Conférence Internationale Wafer-Fab : dans le cadre du Salon International Pronic 86 ; 20 - 21 novembre 1986 = Wafer-Fab International Convention
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Semiconductor Wafer Bonding for Solar Cell Applications: A Review
Wafer‐Scale Synthesis of Graphene on Sapphire: Toward Fab‐Compatible Graphene