Hochschulschrift
Thermal onboard detection of power semiconductor interconnection faults
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783844096194
3844096191
- Dimensions
-
21 cm x 14.8 cm, 219 g
- Extent
-
X, 147 Seiten
- Language
-
Englisch
- Notes
-
Illustrationen, Diagramme
Technische Universität Dortmund, Dissertation, 2024
- Classification
-
Elektrotechnik, Elektronik
- Keyword
-
Fehlererkennung
Mathematisches Modell
Zuverlässigkeit
Zustandsüberwachung
- Event
-
Veröffentlichung
- (where)
-
Düren
- (who)
-
Shaker Verlag
- (when)
-
2024
- Creator
- Contributor
- Table of contents
- Rights
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
-
11.06.2025, 1:51 PM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
Associated
- Jahn, Nils
- Shaker Verlag
- Shaker Verlag
Time of origin
- 2024
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