Trade-offs in sensitivity and sampling depth in bimodal atomic force microscopy and comparison to the trimodal case
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Bibliographic citation
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Trade-offs in sensitivity and sampling depth in bimodal atomic force microscopy and comparison to the trimodal case ; volume:5 ; pages:1144-1151
Beilstein journal of nanotechnology ; 5, 1144-1151
- Classification
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.5.125
- URN
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urn:nbn:de:101:1-201501271090
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:28 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.