Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Erschienen in
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Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces ; volume:5 ; pages:386-393
Beilstein journal of nanotechnology ; 5, 386-393
- Klassifikation
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.5.45
- URN
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urn:nbn:de:101:1-201501261467
- Rechteinformation
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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15.08.2025, 07:33 MESZ
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