Subnanometer localization accuracy in widefield optical microscopy

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
2047-7538
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Subnanometer localization accuracy in widefield optical microscopy ; volume:7 ; number:1 ; day:11 ; month:7 ; year:2018 ; pages:1-15 ; date:12.2018
Light ; 7, Heft 1 (11.7.2018), 1-15, 12.2018

Classification
Physik

Creator
Copeland, Craig R.
Contributor
Geist, Jon
McGray, Craig D.
Aksyuk, Vladimir A.
Liddle, J. Alexander
Ilic, B. Robert
Stavis, Samuel M.
SpringerLink (Online service)

DOI
10.1038/s41377-018-0031-z
URN
urn:nbn:de:101:1-2018091620590307740378
Rights
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:22 AM CEST

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Associated

  • Copeland, Craig R.
  • Geist, Jon
  • McGray, Craig D.
  • Aksyuk, Vladimir A.
  • Liddle, J. Alexander
  • Ilic, B. Robert
  • Stavis, Samuel M.
  • SpringerLink (Online service)

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