Electrical Interface Characterization of Ultrathin Amorphous Silicon Layers on Crystalline Silicon
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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Electrical Interface Characterization of Ultrathin Amorphous Silicon Layers on Crystalline Silicon ; volume:218 ; number:2 ; year:2021
Physica status solidi / A. A, Applications and materials science ; 218, Heft 2 (2021)
- Creator
- DOI
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10.1002/pssa.202000079
- URN
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urn:nbn:de:101:1-2021031314205521472264
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:31 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Thoma, Patrick
- Breyer, Evelyn T.
- Thoma, Oana‐Maria
- Salvan, Georgeta
- Zahn, Dietrich R. T.
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