Ultrathin silicon oxynitride layer on GaN for dangling-bond-free GaN/insulator interface
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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2045-2322
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
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Ultrathin silicon oxynitride layer on GaN for dangling-bond-free GaN/insulator interface ; volume:8 ; number:1 ; day:23 ; month:1 ; year:2018 ; pages:1-10 ; date:12.2018
Scientific reports ; 8, Heft 1 (23.1.2018), 1-10, 12.2018
- Classification
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Naturwissenschaften
- Creator
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Nishio, Kengo
- Contributor
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Yayama, Tomoe
Miyazaki, Takehide
Taoka, Noriyuki
Shimizu, Mitsuaki
SpringerLink (Online service)
- DOI
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10.1038/s41598-018-19283-4
- URN
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urn:nbn:de:1111-201804131319
- Rights
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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14.08.2025, 10:57 AM CEST
Data provider
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Associated
- Nishio, Kengo
- Yayama, Tomoe
- Miyazaki, Takehide
- Taoka, Noriyuki
- Shimizu, Mitsuaki
- SpringerLink (Online service)
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