- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
Device reliability challenges for modern semiconductor circuit design – a review ; volume:7 ; year:2009 ; pages:201-211
Advances in radio science ; 7 (2009), 201-211
- Creator
-
Schlünder, C.
- DOI
-
10.5194/ars-7-201-2009
- URN
-
urn:nbn:de:101:1-2018010216929
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
15.08.2025, 7:29 AM CEST
Data provider
This object is provided by:
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Schlünder, C.
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