Fast quantitative optical detection of heat dissipation by surface plasmon polaritons
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: Nanoscale ; 10 (2018), 25. - S. 11894-11900. - ISSN 2040-3372. - eISSN 2040-3372
- Event
-
Veröffentlichung
- (where)
-
Konstanz
- (who)
-
KOPS Universität Konstanz
- (when)
-
2018
- Creator
-
Möller, Thomas B.
Ganser, Andreas
Kratt, Martina
Dickreuter, Simon
Waitz, Reimar
Scheer, Elke
Boneberg, Johannes
Leiderer, Paul
- URN
-
urn:nbn:de:bsz:352-2-wjppekji8g6v9
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:47 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Möller, Thomas B.
- Ganser, Andreas
- Kratt, Martina
- Dickreuter, Simon
- Waitz, Reimar
- Scheer, Elke
- Boneberg, Johannes
- Leiderer, Paul
- KOPS Universität Konstanz
Time of origin
- 2018
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Nanosecond laser pulse induced vertical movement of thin gold films on silicon determined by a modified Michelson interferometer
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Mit Kapillarkräften zu Nanostrukturen : wie man die Selbstorganisation von Kolloidkügelchen für die Submikrometer-Lithographie nutzen kann
Tuning the transmission of surface plasmon polaritons across nano and micro gaps in gold stripes
Transmission of surface plasmon polaritons through atomic-size constrictions
Time-resolved optical measurement of thermal transport by surface plasmon polaritons in thin metal stripes
Surface-plasmon-enhanced multiple-photon photoemission from Ag and Al films
Nanosecond laser pulse induced vertical movement of thin gold films on silicon determined by a modified Michelson interferometer
Optical near-field imaging and nanostructuring by means of laser ablation
On the interpretation of time-resolved surface reflectivity measurements during the laser annealing of Si thin films
An approach to spectroscopy and phase measurements in scanning plasmon near-field microscopy
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