Infrared reflection absorption spectroscopy for characterization of alkylsilane monolayers on silicon nitride surfaces
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
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Englisch
- Anmerkungen
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In: OCM 2013 - Optical Characterization of Materials - Conference Proceedings, Karlsruhe, 6. - 7. März 2013. Ed.: J. Beyerer, F. Puente León, T. Längle, 89-94, KIT Scientific Publishing, Karlsruhe
- Ereignis
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Veröffentlichung
- (wo)
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Karlsruhe
- (wer)
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KIT Scientific Publishing
- (wann)
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2018
- Urheber
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Stammer, Xia
Heißler, Stefan
Wöll, Christof
- DOI
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10.5445/IR/1000034038
- URN
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urn:nbn:de:swb:90-340382
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:47 MEZ
Datenpartner
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Beteiligte
- Stammer, Xia
- Heißler, Stefan
- Wöll, Christof
- KIT Scientific Publishing
Entstanden
- 2018
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