Defect detection of printed circuit board assembly based on YOLOv5

Location
Deutsche Nationalbibliothek Frankfurt am Main
Extent
1 Online-Ressource.
Language
Englisch

Bibliographic citation
Defect detection of printed circuit board assembly based on YOLOv5 ; volume:14 ; number:1 ; day:20 ; month:8 ; year:2024 ; pages:1-16 ; date:12.2024
Scientific reports ; 14, Heft 1 (20.8.2024), 1-16, 12.2024

Classification
Elektrotechnik, Elektronik

Creator
Shen, Minghui
Liu, Yujie
Chen, Jing
Ye, Kangqi
Gao, Heyuan
Che, Jie
Wang, Qingyang
He, Hao
Liu, Jian
Wang, Yan
Jiang, Ye
Contributor
SpringerLink (Online service)

DOI
10.1038/s41598-024-70176-1
URN
urn:nbn:de:101:1-2411110949403.356728864810
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
15.08.2025, 7:33 AM CEST

Data provider

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Associated

  • Shen, Minghui
  • Liu, Yujie
  • Chen, Jing
  • Ye, Kangqi
  • Gao, Heyuan
  • Che, Jie
  • Wang, Qingyang
  • He, Hao
  • Liu, Jian
  • Wang, Yan
  • Jiang, Ye
  • SpringerLink (Online service)

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