- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
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Defect detection of printed circuit board assembly based on YOLOv5 ; volume:14 ; number:1 ; day:20 ; month:8 ; year:2024 ; pages:1-16 ; date:12.2024
Scientific reports ; 14, Heft 1 (20.8.2024), 1-16, 12.2024
- Classification
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Elektrotechnik, Elektronik
- Creator
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Shen, Minghui
Liu, Yujie
Chen, Jing
Ye, Kangqi
Gao, Heyuan
Che, Jie
Wang, Qingyang
He, Hao
Liu, Jian
Wang, Yan
Jiang, Ye
- Contributor
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SpringerLink (Online service)
- DOI
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10.1038/s41598-024-70176-1
- URN
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urn:nbn:de:101:1-2411110949403.356728864810
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:33 AM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Shen, Minghui
- Liu, Yujie
- Chen, Jing
- Ye, Kangqi
- Gao, Heyuan
- Che, Jie
- Wang, Qingyang
- He, Hao
- Liu, Jian
- Wang, Yan
- Jiang, Ye
- SpringerLink (Online service)