Improved silicon surface passivation by ALD Al2O3/SiO2 multilayers with In‐Situ plasma treatments

Abstract: Al2O3 is one of the most effective dielectric surface passivation layers for silicon solar cells, but recent studies indicate that there is still room for improvement. Instead of a single layer, multilayers of only a few nanometers thickness offer the possibility to tailor material properties on a nanometer scale. In this study, the effect of various plasma treatments performed at different stages during the ALD deposition of Al2O3/SiO2 multilayers on the silicon surface passivation quality is evaluated. Significant improvements in surface passivation quality for some plasma treatments are observed, particularly for single Al2O3/SiO2 bilayers treated with a H2 plasma after SiO2 deposition. This treatment resulted in a surface recombination parameter J0 as low as 0.35 fA cm−2 on (100) surfaces of 10 Ω cm n-type silicon, more than a factor of 5 lower than that of Al2O3 single layers without plasma treatment. Capacitance-voltage measurements indicate that the improved surface passivation of the plasma-treated samples results from an enhanced chemical interface passivation rather than an improved field effect. In addition, a superior temperature stability of the surface passivation quality is found for various plasma-treated multilayers

Standort
Deutsche Nationalbibliothek Frankfurt am Main
Umfang
Online-Ressource
Sprache
Englisch
Anmerkungen
Advanced materials interfaces. - 10, 16 (2023) , 2202469, ISSN: 2196-7350

Ereignis
Veröffentlichung
(wo)
Freiburg
(wer)
Universität
(wann)
2023
Urheber
Richter, Armin
Patel, Hemangi
Reichel, Christian
Benick, Jan
Glunz, Stefan

DOI
10.1002/admi.202202469
URN
urn:nbn:de:bsz:25-freidok-2377772
Rechteinformation
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Letzte Aktualisierung
14.08.2024, 10:45 MESZ

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Beteiligte

  • Richter, Armin
  • Patel, Hemangi
  • Reichel, Christian
  • Benick, Jan
  • Glunz, Stefan
  • Universität

Entstanden

  • 2023

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