An integrated evanescent field sensor for the simultaneous measurement of layer refractive index and thickness

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Standort
Deutsche Nationalbibliothek Frankfurt am Main
Umfang
Online-Ressource
Sprache
Englisch

Erschienen in
In: Sensors (21:5) - Basel : MDPI - Art.-Id. 1628

Ereignis
Veröffentlichung
(wo)
Berlin
(wer)
Technische Universität Berlin
(wann)
2022
Urheber
Jäger, Matthias
Bruns, Jürgen
Schneidewind, Jessica
Pinnow, Cay
Gargouri, Hassan
Petermann, Klaus

DOI
10.14279/depositonce-14895
Handle
11303/16121
URN
urn:nbn:de:101:1-2022011901044354122472
Rechteinformation
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Letzte Aktualisierung
15.08.2025, 07:24 MESZ

Datenpartner

Dieses Objekt wird bereitgestellt von:
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Beteiligte

  • Jäger, Matthias
  • Bruns, Jürgen
  • Schneidewind, Jessica
  • Pinnow, Cay
  • Gargouri, Hassan
  • Petermann, Klaus
  • Technische Universität Berlin

Entstanden

  • 2022

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