An integrated evanescent field sensor for the simultaneous measurement of layer refractive index and thickness

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Bibliographic citation: In: Sensors (21:5) - Basel : MDPI - Art.-Id. 1628

Event: Veröffentlichung

(where): Berlin

(who): Technische Universität Berlin

(when): 2022

Creator: Jäger, Matthias
Bruns, Jürgen
Schneidewind, Jessica
Pinnow, Cay
Gargouri, Hassan
Petermann, Klaus

DOI: 10.14279/depositonce-14895

Handle: 11303/16121

URN: urn:nbn:de:101:1-2022011901044354122472

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 15.08.2025, 7:24 AM CEST

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Associated

Jäger, Matthias
Bruns, Jürgen
Schneidewind, Jessica
Pinnow, Cay
Gargouri, Hassan
Petermann, Klaus
Technische Universität Berlin

Time of origin

2022

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An integrated evanescent field sensor for the simultaneous measurement of layer refractive index and thickness

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Other Objects (12)

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Refractive index sensor with magnified resonant signal

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