Hochschulschrift
Techniques to prevent sample surface charging and reduce beam damage effects for SBEM imaging
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
Heidelberg, Universität Heidelberg, Dissertation, 2013
- Schlagwort
-
Electron microscopy
Nerve tissue
Neural circuitry
Optics
- Ereignis
-
Veröffentlichung
- (wo)
-
Heidelberg
- (wer)
-
Universitätsbibliothek Heidelberg
- (wann)
-
2013
- Urheber
- Beteiligte Personen und Organisationen
-
Denk, Winfried
- DOI
-
10.11588/heidok.00015372
- URN
-
urn:nbn:de:bsz:16-heidok-153721
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 10:45 MESZ
Datenpartner
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Objekttyp
- Hochschulschrift
Beteiligte
- Titze, Benjamin
- Denk, Winfried
- Universitätsbibliothek Heidelberg
Entstanden
- 2013
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