Approximant-based orientation determination of quasicrystals using electron backscatter diffraction

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Standort
Deutsche Nationalbibliothek Frankfurt am Main
Umfang
Online-Ressource
Sprache
Englisch

Erschienen in
In: Ultramicroscopy, 218, S. 113093-

Ereignis
Veröffentlichung
(wo)
Berlin
(wer)
Bundesanstalt für Materialforschung und -prüfung (BAM)
(wann)
2020
Urheber
Cios, G.
Nolze, Gert
Winkelmann, A.
Tokarski, T.
Hielscher, R.
Strzalka, R.
Buganski, I.
Wolny, J.
Bala, P.

DOI
10.1016/j.ultramic.2020.113093
URN
urn:nbn:de:kobv:b43-514221
Rechteinformation
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Letzte Aktualisierung
15.08.2025, 07:28 MESZ

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Beteiligte

  • Cios, G.
  • Nolze, Gert
  • Winkelmann, A.
  • Tokarski, T.
  • Hielscher, R.
  • Strzalka, R.
  • Buganski, I.
  • Wolny, J.
  • Bala, P.
  • Bundesanstalt für Materialforschung und -prüfung (BAM)

Entstanden

  • 2020

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