Approximant-based orientation determination of quasicrystals using electron backscatter diffraction

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Location: Deutsche Nationalbibliothek Frankfurt am Main

Extent: Online-Ressource

Language: Englisch

Bibliographic citation: In: Ultramicroscopy, 218, S. 113093-

Event: Veröffentlichung

(where): Berlin

(who): Bundesanstalt für Materialforschung und -prüfung (BAM)

(when): 2020

Creator: Cios, G.
Nolze, Gert
Winkelmann, A.
Tokarski, T.
Hielscher, R.
Strzalka, R.
Buganski, I.
Wolny, J.
Bala, P.

DOI: 10.1016/j.ultramic.2020.113093

URN: urn:nbn:de:kobv:b43-514221

Rights: Der Zugriff auf das Objekt ist unbeschränkt möglich.

Last update: 25.03.2025, 1:43 PM CET

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Associated

Cios, G.
Nolze, Gert
Winkelmann, A.
Tokarski, T.
Hielscher, R.
Strzalka, R.
Buganski, I.
Wolny, J.
Bala, P.
Bundesanstalt für Materialforschung und -prüfung (BAM)

Time of origin

2020

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Approximant-based orientation determination of quasicrystals using electron backscatter diffraction

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Other Objects (12)

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Gas-phase electron diffraction

Stereochemical applications of gas phase electron diffraction, Pt. A.. The electron diffraction technique

Electron diffraction and controlled molecules

New developments in electron diffraction

ODF determination from electron diffraction measurement and spline interpolation for pole figure inversion

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Materials Testing - Electron Backscatter Diffraction - EBSD -

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