High-Throughput Microstructural Characterization and Process Correlation Using Automated Electron Backscatter Diffraction

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Standort: Deutsche Nationalbibliothek Frankfurt am Main

Umfang: 1 Online-Ressource.

Sprache: Englisch

Erschienen in: High-Throughput Microstructural Characterization and Process Correlation Using Automated Electron Backscatter Diffraction ; volume:13 ; number:3 ; day:28 ; month:6 ; year:2024 ; pages:641-655 ; date:9.2024
Integrating materials and manufacturing innovation ; 13, Heft 3 (28.6.2024), 641-655, 9.2024

Klassifikation: Biowissenschaften, Biologie

Urheber: Fowler, J. Elliott
Ruggles, Timothy J.
Cillessen, Dale E.
Johnson, Kyle L.
Jauregui, Luis J.
Craig, Robert L.
Bianco, Nathan R.
Henriksen, Amelia A.
Boyce, Brad L.

Beteiligte Personen und Organisationen: SpringerLink (Online service)

DOI: 10.1007/s40192-024-00366-2

URN: urn:nbn:de:101:1-2411261045264.042053809665

Rechteinformation: Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.

Letzte Aktualisierung: 15.08.2025, 07:21 MESZ

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Beteiligte

Fowler, J. Elliott
Ruggles, Timothy J.
Cillessen, Dale E.
Johnson, Kyle L.
Jauregui, Luis J.
Craig, Robert L.
Bianco, Nathan R.
Henriksen, Amelia A.
Boyce, Brad L.
SpringerLink (Online service)

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High-Throughput Microstructural Characterization and Process Correlation Using Automated Electron Backscatter Diffraction

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