Dislocation substructures in pure aluminium after creep deformation as studied by electron backscatter diffraction
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: Journal of Applied Crystallography, 55, S. 1-10
- Ereignis
-
Veröffentlichung
- (wo)
-
Berlin
- (wer)
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Bundesanstalt für Materialforschung und -prüfung (BAM)
- (wann)
-
2022
- Urheber
- DOI
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10.1107/S1600576722005209
- URN
-
urn:nbn:de:kobv:b43-552003
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:43 MEZ
Datenpartner
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Beteiligte
- Serrano-Munoz, Itziar
- Fernández, R.
- Saliwan-Neumann, Romeo
- González-Doncel, G.
- Bruno, Giovanni
- Bundesanstalt für Materialforschung und -prüfung (BAM)
Entstanden
- 2022
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