Extended lifetime qualification concepts for automotive semiconductor components
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Schlagwort
-
Kraftfahrzeugindustrie ; Autonomes Fahrzeug ; Elektrofahrzeug ; Halbleitertechnologie ; Zuverlässigkeit ; Lebensdauer ; Technikbewertung
- Ereignis
-
Veröffentlichung
- (wo)
-
Neubiberg
- (wer)
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Universitätsbibliothek der Universität der Bundeswehr München
- (wann)
-
2020
- Urheber
-
Lehndorff, Thomas
Abelein, Ulrich
Alsioufy, Adnan
Hirler, Alexander
Sulima, Torsten
Simon, Stefan
Lochner, Helmut
Hansch, Walter
- DOI
-
10.18726/2020_2
- URN
-
urn:nbn:de:bvb:706-6493
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 10:48 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Lehndorff, Thomas
- Abelein, Ulrich
- Alsioufy, Adnan
- Hirler, Alexander
- Sulima, Torsten
- Simon, Stefan
- Lochner, Helmut
- Hansch, Walter
- Universitätsbibliothek der Universität der Bundeswehr München
Entstanden
- 2020
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