Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
2198-0926
- Umfang
-
Online-Ressource
- Sprache
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Englisch
- Anmerkungen
-
online resource.
- Erschienen in
-
Sub-Ångstrom electric field measurements on a universal detector in a scanning transmission electron microscope ; volume:4 ; number:1 ; day:24 ; month:8 ; year:2018 ; pages:1-10 ; date:12.2018
Advanced structural and chemical imaging ; 4, Heft 1 (24.8.2018), 1-10, 12.2018
- Urheber
- Beteiligte Personen und Organisationen
-
Idrobo, Juan Carlos
Chi, Miaofang
SpringerLink (Online service)
- DOI
-
10.1186/s40679-018-0059-4
- URN
-
urn:nbn:de:101:1-2018101901374856514281
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
15.08.2025, 07:34 MESZ
Datenpartner
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Beteiligte
- Hachtel, Jordan A.
- Idrobo, Juan Carlos
- Chi, Miaofang
- SpringerLink (Online service)
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