X-ray diffuse scattering from self-organized mesoscopic semiconductor structures
This monograph represents a critical survey about the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic materials systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers and is of particular relevance at semiconductor layer systems where e.g. interface roughness or low- dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesocopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine both aspects of self-organized growth of mesoscopic structures and respective X-ray diffuse scattering experiments. TOC:A Brief Introduction to the Topic.- BasicPrinciples of X-Ray Diffuse Scattering on Mesoscopic Structures.- Experimental Optimization.- A Model System: LPE SiGe/Si(001) Islands.- Dynamical Scattering at Grazing Incidence.- Characterization of Quantum Dots.- Characterization of Interface Roughness.- Appendix.
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
-
9783540201793
3540201793
- Maße
-
24 cm
- Umfang
-
X, 202 S.
- Sprache
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Englisch
- Anmerkungen
-
graph. Darst.
Literaturangaben
- Erschienen in
-
Springer tracts in modern physics ; Vol. 199
- Klassifikation
-
Physik
- Schlagwort
-
Halbleiter
Mesoskopisches System
Schichtwachstum
Selbstorganisation
Röntgenstreuung
Diffuse Streuung
- Ereignis
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Veröffentlichung
- (wo)
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Berlin, Heidelberg, New York, Hong Kong, London, Milan, Paris, Tokyo
- (wer)
-
Springer
- (wann)
-
2004
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 14:14 MESZ
Datenpartner
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Schmidbauer, Martin
- Springer
Entstanden
- 2004
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