X-ray diffuse scattering from self-organized mesoscopic semiconductor structures
This monograph represents a critical survey about the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic materials systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers and is of particular relevance at semiconductor layer systems where e.g. interface roughness or low- dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesocopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine both aspects of self-organized growth of mesoscopic structures and respective X-ray diffuse scattering experiments. TOC:A Brief Introduction to the Topic.- BasicPrinciples of X-Ray Diffuse Scattering on Mesoscopic Structures.- Experimental Optimization.- A Model System: LPE SiGe/Si(001) Islands.- Dynamical Scattering at Grazing Incidence.- Characterization of Quantum Dots.- Characterization of Interface Roughness.- Appendix.
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISBN
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9783540201793
3540201793
- Dimensions
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24 cm
- Extent
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X, 202 S.
- Language
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Englisch
- Notes
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graph. Darst.
Literaturangaben
- Bibliographic citation
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Springer tracts in modern physics ; Vol. 199
- Classification
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Physik
- Keyword
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Halbleiter
Mesoskopisches System
Schichtwachstum
Selbstorganisation
Röntgenstreuung
Diffuse Streuung
- Event
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Veröffentlichung
- (where)
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Berlin, Heidelberg, New York, Hong Kong, London, Milan, Paris, Tokyo
- (who)
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Springer
- (when)
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2004
- Creator
- Table of contents
- Rights
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Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Last update
- 11.06.2025, 2:14 PM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Schmidbauer, Martin
- Springer
Time of origin
- 2004
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