Hochschulschrift | Online-Publikation
Symbolic methods for testing digital circuits
- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
Freiburg (Breisgau), Univ., Diss., 2003
- Classification
-
Ingenieurwissenschaften und Maschinenbau
Informatik
- Keyword
-
Logische Schaltung
Testmuster
OBDD
Testen ; Datenstruktur ; Binäres Entscheidungsdiagramm ; Entscheidungsgraph ; OBDD ; Logische Schaltung ; Halbleiterschaltung ; Testmuster
- Creator
-
Keim, Martin
- URN
-
urn:nbn:de:bsz:25-opus-12489
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
- 15.08.2025, 7:35 AM CEST
Data provider
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Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Object type
- Hochschulschrift
- Online-Publikation
Associated
- Keim, Martin
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