- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Erschienen in
-
In: Denkena, B.; Dittrich, M.-A.; Noske, H.; Witt, M.: Statistical approaches for semi-supervised anomaly detection in machining. In: Production Engineering 14 (2020), Nr. 3, S. 385-393. DOI: https://doi.org/10.1007/s11740-020-00958-9
- Ereignis
-
Veröffentlichung
- (wo)
-
Hannover
- (wer)
-
Gottfried Wilhelm Leibniz Universität Hannover
- (wann)
-
2020
- Ereignis
-
Veröffentlichung
- (wo)
-
Hannover
- (wer)
-
Technische Informationsbibliothek (TIB)
- (wann)
-
2020
- Urheber
-
Denkena, B.
Dittrich, M.-A.
Noske, H.
Witt, M.
- DOI
-
10.15488/15025
- URN
-
urn:nbn:de:101:1-2023102602245051060595
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
25.03.2025, 13:52 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Denkena, B.
- Dittrich, M.-A.
- Noske, H.
- Witt, M.
- Gottfried Wilhelm Leibniz Universität Hannover
- Technische Informationsbibliothek (TIB)
Entstanden
- 2020
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