- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
1573-0727
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
online resource.
- Bibliographic citation
-
A CMOS Ripple Detector for Voltage Regulator Testing ; volume:32 ; number:2 ; day:28 ; month:1 ; year:2016 ; pages:227-233 ; date:4.2016
Journal of electronic testing ; 32, Heft 2 (28.1.2016), 227-233, 4.2016
- Creator
-
Nguyen, Hieu
- Contributor
-
Ozmen, Cagatay
Dirican, Aydin
Tan, Nurettin
Margala, Martin
SpringerLink (Online service)
- DOI
-
10.1007/s10836-016-5566-4
- URN
-
urn:nbn:de:1111-2016033122228
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:54 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Nguyen, Hieu
- Ozmen, Cagatay
- Dirican, Aydin
- Tan, Nurettin
- Margala, Martin
- SpringerLink (Online service)
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