Self-Supervised Learning for Industrial Image Anomaly Detection by Simulating Anomalous Samples
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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1 Online-Ressource.
- Language
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Englisch
- Bibliographic citation
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Self-Supervised Learning for Industrial Image Anomaly Detection by Simulating Anomalous Samples ; volume:16 ; number:1 ; day:20 ; month:9 ; year:2023 ; pages:1-15 ; date:12.2023
International journal of computational intelligence systems ; 16, Heft 1 (20.9.2023), 1-15, 12.2023
- Creator
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Pei, Mingjing
Liu, Ningzhong
Zhao, Bing
Sun, Han
- Contributor
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SpringerLink (Online service)
- DOI
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10.1007/s44196-023-00328-0
- URN
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urn:nbn:de:101:1-2024020112352335105744
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
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15.08.2025, 7:38 AM CEST
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Associated
- Pei, Mingjing
- Liu, Ningzhong
- Zhao, Bing
- Sun, Han
- SpringerLink (Online service)
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