Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Sprache
-
Englisch
- Erschienen in
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In: Journal of Applied Physics ; 108 (2010), 6. - 63528
- Klassifikation
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Physik
- Ereignis
-
Veröffentlichung
- (wo)
-
Konstanz
- (wer)
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Bibliothek der Universität Konstanz
- (wann)
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2011
- Urheber
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Ganapati, Vidya
Schoenfelder, Stephan
Castellanos, Sergio
Oener, Sebastian
Koepge, Ringo
Sampson, Aaron
Marcus, Matthew A.
Lai, Barry
Morhenn, Humphrey
Hahn, Giso
Bagdahn, Jörg
Buonassisi, Tonio
- URN
-
urn:nbn:de:bsz:352-133400
- Rechteinformation
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 10:58 MESZ
Datenpartner
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Beteiligte
- Ganapati, Vidya
- Schoenfelder, Stephan
- Castellanos, Sergio
- Oener, Sebastian
- Koepge, Ringo
- Sampson, Aaron
- Marcus, Matthew A.
- Lai, Barry
- Morhenn, Humphrey
- Hahn, Giso
- Bagdahn, Jörg
- Buonassisi, Tonio
- Bibliothek der Universität Konstanz
Entstanden
- 2011
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