Infrared birefringence imaging of residual stress and bulk defects in multicrystalline silicon
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
-
Englisch
- Bibliographic citation
-
In: Journal of Applied Physics ; 108 (2010), 6. - 63528
- Classification
-
Physik
- Event
-
Veröffentlichung
- (where)
-
Konstanz
- (who)
-
Bibliothek der Universität Konstanz
- (when)
-
2011
- Creator
-
Ganapati, Vidya
Schoenfelder, Stephan
Castellanos, Sergio
Oener, Sebastian
Koepge, Ringo
Sampson, Aaron
Marcus, Matthew A.
Lai, Barry
Morhenn, Humphrey
Hahn, Giso
Bagdahn, Jörg
Buonassisi, Tonio
- URN
-
urn:nbn:de:bsz:352-133400
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 10:58 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Ganapati, Vidya
- Schoenfelder, Stephan
- Castellanos, Sergio
- Oener, Sebastian
- Koepge, Ringo
- Sampson, Aaron
- Marcus, Matthew A.
- Lai, Barry
- Morhenn, Humphrey
- Hahn, Giso
- Bagdahn, Jörg
- Buonassisi, Tonio
- Bibliothek der Universität Konstanz
Time of origin
- 2011
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