On the chemical composition of TiAlN thin films : Comparison of ion beam analysis and laser-assisted atom probe tomography with varying laser pulse energy
- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- Extent
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Online-Ressource
- Language
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Englisch
- Bibliographic citation
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In: 10.1016/j.tsf.2019.04.026
- Event
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Veröffentlichung
- (where)
-
Aachen
- (who)
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Universitätsbibliothek der RWTH Aachen
- (when)
-
2019
- Creator
- DOI
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10.18154/RWTH-2019-08307
- URN
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urn:nbn:de:101:1-2020110916152291739050
- Rights
-
Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
25.03.2025, 1:54 PM CET
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Hans, Marcus
- Schneider, Jochen M.
- Universitätsbibliothek der RWTH Aachen
Time of origin
- 2019
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Modeling of metastable phase formation for sputtered Ti1−xAlxN and V1−xAlxN thin films
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Laser additive manufacturing of oxide dispersion strengthened steels and Cu-Cr-Nb alloys
How high is the entropy in high entropy ceramics?
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Computer vision assisted decomposition analysis of atom probe tomography data
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Effect of the Free Volume on the Electronic Structure of Cu70Zr30 Metallic Glasses
Application of cryo-atom probe tomography to the study of liquid - solid interfaces at near atomic scale
Convective Flow Redistribution of Oxygen by Laser Melting of a Zr-Based Amorphous Alloy
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