- Location
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
2044-5326
- Extent
-
Online-Ressource
- Language
-
Englisch
- Notes
-
online resource.
- Bibliographic citation
-
On-chip environmentally assisted cracking in thin freestanding SiO2 films ; day:14 ; month:4 ; year:2021 ; pages:1-16
Journal of materials research ; (14.4.2021), 1-16
- Creator
-
Jaddi, Sahar
Raskin, Jean-Pierre
Pardoen, Thomas
- Contributor
-
SpringerLink (Online service)
- DOI
-
10.1557/s43578-021-00189-3
- URN
-
urn:nbn:de:101:1-2021060320400831584069
- Rights
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 11:01 AM CEST
Data provider
This object is provided by:
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Jaddi, Sahar
- Raskin, Jean-Pierre
- Pardoen, Thomas
- SpringerLink (Online service)
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