- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
2044-5326
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
online resource.
- Erschienen in
-
On-chip environmentally assisted cracking in thin freestanding SiO2 films ; day:14 ; month:4 ; year:2021 ; pages:1-16
Journal of materials research ; (14.4.2021), 1-16
- Urheber
-
Jaddi, Sahar
Raskin, Jean-Pierre
Pardoen, Thomas
- Beteiligte Personen und Organisationen
-
SpringerLink (Online service)
- DOI
-
10.1557/s43578-021-00189-3
- URN
-
urn:nbn:de:101:1-2021060320400831584069
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
14.08.2025, 11:01 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Beteiligte
- Jaddi, Sahar
- Raskin, Jean-Pierre
- Pardoen, Thomas
- SpringerLink (Online service)
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