Hochschulschrift
Characterization of wet-chemically and photo-chemically modified silicon surfaces with scanning force microscopy
- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- Maße
-
30 cm
- Umfang
-
XVIII, 139 Bl.
- Sprache
-
Englisch
- Anmerkungen
-
Ill., graph. Darst.
Heidelberg, Univ., Diss., 2004
- Klassifikation
-
Chemie
- Schlagwort
-
Silicium
Kristallfläche
Oxidation
Rasterkraftmikroskopie
- Urheber
- Inhaltsverzeichnis
- Rechteinformation
-
Bei diesem Objekt liegt nur das Inhaltsverzeichnis digital vor. Der Zugriff darauf ist unbeschränkt möglich.
- Letzte Aktualisierung
-
11.06.2025, 14:04 MESZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
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Objekttyp
- Hochschulschrift
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