Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism
- Standort
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Deutsche Nationalbibliothek Frankfurt am Main
- Umfang
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Online-Ressource
- Erschienen in
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Imaging ultra thin layers with helium ion microscopy: Utilizing the channeling contrast mechanism ; volume:3 ; pages:507-512
Beilstein journal of nanotechnology ; 3, 507-512
- Klassifikation
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Ingenieurwissenschaften und Maschinenbau
- DOI
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10.3762/bjnano.3.58
- URN
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urn:nbn:de:101:1-201210164458
- Rechteinformation
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Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
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15.08.2025, 07:36 MESZ
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