- Standort
-
Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
-
1573-4862
- Umfang
-
Online-Ressource
- Sprache
-
Englisch
- Anmerkungen
-
online resource.
- Erschienen in
-
Multiple Wavemode Scanning for Near and Far-Side Defect Characterisation ; volume:39 ; number:1 ; day:8 ; month:1 ; year:2020 ; pages:1-8 ; date:3.2020
Journal of nondestructive evaluation ; 39, Heft 1 (8.1.2020), 1-8, 3.2020
- Urheber
-
Xiang, L.
Edwards, R S.
- Beteiligte Personen und Organisationen
-
SpringerLink (Online service)
- DOI
-
10.1007/s10921-019-0651-0
- URN
-
urn:nbn:de:101:1-2020052921134325173355
- Rechteinformation
-
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Letzte Aktualisierung
-
05.05.190728634, 05:02 MEZ
Datenpartner
Dieses Objekt wird bereitgestellt von:
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Deutsche Nationalbibliothek. Bei Fragen zum Objekt wenden Sie sich bitte an den Datenpartner.
Beteiligte
- Xiang, L.
- Edwards, R S.
- SpringerLink (Online service)
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