- Location
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Deutsche Nationalbibliothek Frankfurt am Main
- ISSN
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1573-4862
- Extent
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Online-Ressource
- Language
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Englisch
- Notes
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online resource.
- Bibliographic citation
-
Multiple Wavemode Scanning for Near and Far-Side Defect Characterisation ; volume:39 ; number:1 ; day:8 ; month:1 ; year:2020 ; pages:1-8 ; date:3.2020
Journal of nondestructive evaluation ; 39, Heft 1 (8.1.2020), 1-8, 3.2020
- Creator
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Xiang, L.
Edwards, R S.
- Contributor
-
SpringerLink (Online service)
- DOI
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10.1007/s10921-019-0651-0
- URN
-
urn:nbn:de:101:1-2020052921134325173355
- Rights
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Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
- Last update
-
14.08.2025, 12:45 PM CEST
Data provider
Deutsche Nationalbibliothek. If you have any questions about the object, please contact the data provider.
Associated
- Xiang, L.
- Edwards, R S.
- SpringerLink (Online service)