Multiple Wavemode Scanning for Near and Far-Side Defect Characterisation

Location
Deutsche Nationalbibliothek Frankfurt am Main
ISSN
1573-4862
Extent
Online-Ressource
Language
Englisch
Notes
online resource.

Bibliographic citation
Multiple Wavemode Scanning for Near and Far-Side Defect Characterisation ; volume:39 ; number:1 ; day:8 ; month:1 ; year:2020 ; pages:1-8 ; date:3.2020
Journal of nondestructive evaluation ; 39, Heft 1 (8.1.2020), 1-8, 3.2020

Creator
Xiang, L.
Edwards, R S.
Contributor
SpringerLink (Online service)

DOI
10.1007/s10921-019-0651-0
URN
urn:nbn:de:101:1-2020052921134325173355
Rights
Open Access; Der Zugriff auf das Objekt ist unbeschränkt möglich.
Last update
14.08.2025, 12:45 PM CEST

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Associated

  • Xiang, L.
  • Edwards, R S.
  • SpringerLink (Online service)

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