Analyzing degradation effects of organic light-emitting diodes via transient optical and electrical measurements

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Standort
Deutsche Nationalbibliothek Frankfurt am Main
Umfang
Online-Ressource
Sprache
Englisch

Erschienen in
In: Journal of Applied Physics, 117, 21, S. 215502-

Klassifikation
Physik

Ereignis
Veröffentlichung
(wo)
Augsburg
(wer)
Universität Augsburg
(wann)
2015
Ereignis
Veröffentlichung
(wo)
Melville, NY
(wer)
AIP
(wann)
2015
Urheber
Schmidt, Tobias D.
Jäger, Lars
Noguchi, Yutaka
Ishii, Hisao
Brütting, Wolfgang

DOI
10.1063/1.4921829
URN
urn:nbn:de:bvb:384-opus4-399931
Rechteinformation
Der Zugriff auf das Objekt ist unbeschränkt möglich.
Letzte Aktualisierung
14.08.2025, 11:01 MESZ

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Beteiligte

  • Schmidt, Tobias D.
  • Jäger, Lars
  • Noguchi, Yutaka
  • Ishii, Hisao
  • Brütting, Wolfgang
  • Universität Augsburg
  • AIP

Entstanden

  • 2015

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